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afm height profiles  (NT MDT America Inc)
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atomic force microscopy afm  (Oxford Instruments)
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Oxford Instruments atomic force microscopy afm
Atomic Force Microscopy Afm, supplied by Oxford Instruments, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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atomic force microscopy  (JEOL)
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JEOL atomic force microscopy
Atomic Force Microscopy, supplied by JEOL, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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atomic force microscope  (Hitachi Ltd)
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Hitachi Ltd atomic force microscope
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ac mode atomic force microscopy ac afm  (Oxford Instruments)
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atomic force microscopy dpn 5000  (NanoInk Inc)
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atomic force microscopy afm  (Dynasil Inc)
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Dynasil Inc atomic force microscopy afm
Measurement techniques used in the study. ( a ) Optical <t>microscopy.</t> The white and blue arrows indicate the strain directions relative to the long lengths of the wires used in the study. The characteristic crack spacing is indicated by λ . ( b ) Scanning electron microscopy (SEM)—the crack width f is visible. The inset shows a depth profile of a crack. ( c ) Atomic force microscopy (AFM) was used to measure the evaporated film thickness and uniformity. ( d ) Optical interference microscopy was used to produce non-contact, large surface tomography of cracking and buckling. ( e ) Piezoresistance characterization via current-voltage ( IV ) measurements using a probe station. The inset shows how the IV changes with applied strain.
Atomic Force Microscopy Afm, supplied by Dynasil Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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atomic force microscopy (afm)  (PT Tempo Scan)
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PT Tempo Scan atomic force microscopy (afm)
Measurement techniques used in the study. ( a ) Optical <t>microscopy.</t> The white and blue arrows indicate the strain directions relative to the long lengths of the wires used in the study. The characteristic crack spacing is indicated by λ . ( b ) Scanning electron microscopy (SEM)—the crack width f is visible. The inset shows a depth profile of a crack. ( c ) Atomic force microscopy (AFM) was used to measure the evaporated film thickness and uniformity. ( d ) Optical interference microscopy was used to produce non-contact, large surface tomography of cracking and buckling. ( e ) Piezoresistance characterization via current-voltage ( IV ) measurements using a probe station. The inset shows how the IV changes with applied strain.
Atomic Force Microscopy (Afm), supplied by PT Tempo Scan, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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mfp-3d infinity atomic force microscope  (Asylum Research Inc)
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Asylum Research Inc mfp-3d infinity atomic force microscope
Measurement techniques used in the study. ( a ) Optical <t>microscopy.</t> The white and blue arrows indicate the strain directions relative to the long lengths of the wires used in the study. The characteristic crack spacing is indicated by λ . ( b ) Scanning electron microscopy (SEM)—the crack width f is visible. The inset shows a depth profile of a crack. ( c ) Atomic force microscopy (AFM) was used to measure the evaporated film thickness and uniformity. ( d ) Optical interference microscopy was used to produce non-contact, large surface tomography of cracking and buckling. ( e ) Piezoresistance characterization via current-voltage ( IV ) measurements using a probe station. The inset shows how the IV changes with applied strain.
Mfp 3d Infinity Atomic Force Microscope, supplied by Asylum Research Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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atomic force microscope afm anton paar - toscatm 200  (Anton Paar)
90
Anton Paar atomic force microscope afm anton paar - toscatm 200
Measurement techniques used in the study. ( a ) Optical <t>microscopy.</t> The white and blue arrows indicate the strain directions relative to the long lengths of the wires used in the study. The characteristic crack spacing is indicated by λ . ( b ) Scanning electron microscopy (SEM)—the crack width f is visible. The inset shows a depth profile of a crack. ( c ) Atomic force microscopy (AFM) was used to measure the evaporated film thickness and uniformity. ( d ) Optical interference microscopy was used to produce non-contact, large surface tomography of cracking and buckling. ( e ) Piezoresistance characterization via current-voltage ( IV ) measurements using a probe station. The inset shows how the IV changes with applied strain.
Atomic Force Microscope Afm Anton Paar Toscatm 200, supplied by Anton Paar, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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atomic force microscope (afm, asylum research mpf-3d  (Asylum Research Inc)
90
Asylum Research Inc atomic force microscope (afm, asylum research mpf-3d
Measurement techniques used in the study. ( a ) Optical <t>microscopy.</t> The white and blue arrows indicate the strain directions relative to the long lengths of the wires used in the study. The characteristic crack spacing is indicated by λ . ( b ) Scanning electron microscopy (SEM)—the crack width f is visible. The inset shows a depth profile of a crack. ( c ) Atomic force microscopy (AFM) was used to measure the evaporated film thickness and uniformity. ( d ) Optical interference microscopy was used to produce non-contact, large surface tomography of cracking and buckling. ( e ) Piezoresistance characterization via current-voltage ( IV ) measurements using a probe station. The inset shows how the IV changes with applied strain.
Atomic Force Microscope (Afm, Asylum Research Mpf 3d, supplied by Asylum Research Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/icon+atomic+force+microscope+afm/mpf+3d+afm/10__1007_slash_s40145___019___0344___2-53-9-13
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afm5500m atomic force microscope  (Hitachi Ltd)
96
Hitachi Ltd afm5500m atomic force microscope
Measurement techniques used in the study. ( a ) Optical <t>microscopy.</t> The white and blue arrows indicate the strain directions relative to the long lengths of the wires used in the study. The characteristic crack spacing is indicated by λ . ( b ) Scanning electron microscopy (SEM)—the crack width f is visible. The inset shows a depth profile of a crack. ( c ) Atomic force microscopy (AFM) was used to measure the evaporated film thickness and uniformity. ( d ) Optical interference microscopy was used to produce non-contact, large surface tomography of cracking and buckling. ( e ) Piezoresistance characterization via current-voltage ( IV ) measurements using a probe station. The inset shows how the IV changes with applied strain.
Afm5500m Atomic Force Microscope, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Measurement techniques used in the study. ( a ) Optical microscopy. The white and blue arrows indicate the strain directions relative to the long lengths of the wires used in the study. The characteristic crack spacing is indicated by λ . ( b ) Scanning electron microscopy (SEM)—the crack width f is visible. The inset shows a depth profile of a crack. ( c ) Atomic force microscopy (AFM) was used to measure the evaporated film thickness and uniformity. ( d ) Optical interference microscopy was used to produce non-contact, large surface tomography of cracking and buckling. ( e ) Piezoresistance characterization via current-voltage ( IV ) measurements using a probe station. The inset shows how the IV changes with applied strain.

Journal: Scientific Reports

Article Title: Cracking effects in squashable and stretchable thin metal films on PDMS for flexible microsystems and electronics

doi: 10.1038/s41598-018-27798-z

Figure Lengend Snippet: Measurement techniques used in the study. ( a ) Optical microscopy. The white and blue arrows indicate the strain directions relative to the long lengths of the wires used in the study. The characteristic crack spacing is indicated by λ . ( b ) Scanning electron microscopy (SEM)—the crack width f is visible. The inset shows a depth profile of a crack. ( c ) Atomic force microscopy (AFM) was used to measure the evaporated film thickness and uniformity. ( d ) Optical interference microscopy was used to produce non-contact, large surface tomography of cracking and buckling. ( e ) Piezoresistance characterization via current-voltage ( IV ) measurements using a probe station. The inset shows how the IV changes with applied strain.

Article Snippet: The thickness, roughness, and uniformity of the evaporated metal films were measured using atomic force microscopy (AFM)—see Fig. (see Supplementary Table ).

Techniques: Microscopy, Electron Microscopy, Tomography